Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-04-11
2006-04-11
Ho, Tu-Tu (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257S516000
Reexamination Certificate
active
07026680
ABSTRACT:
An integrated thin film capacitive element comprising a dielectric material of the specified composition that exhibits increased voltage tunability of capacitance and capacitance density and a production process thereof are disclosed. The integrated thin film capacitive element comprises a capacitor structure constituted from a lower electrode, a dielectric layer comprised of the high dielectric constant material represented by the formula: (Ba(1-y)(1-x)Sr(1-y)xYy)Ti1+zO3+δwith the range 0<x<1, 0.007<y<0.02, −1<δ<0.5, and (Ba(1-y)(1-x)+Sr(1-y)x)/Ti1+z<1, and an upper electrode. An electronic device comprising the capacitive element of the present invention is also disclosed.
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Baniecki John David
Kurihara Kazuaki
Shioga Takeshi
Fujitsu Limited
Ho Tu-Tu
Westerman Hattori Daniels & Adrian LLP
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