Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-04-11
2006-04-11
Quach, T. N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S388000, C257S412000
Reexamination Certificate
active
07026689
ABSTRACT:
A gate structure includes a gate dielectric layer disposed on a semiconductor substrate. A metal gate conductor is disposed on the gate dielectric layer. A cap layer is disposed on the metal gate conductor. At least one spacer covers sidewalls of the metal gate conductor and the cap layer, such that the cap layer and the spacer encloses the metal gate conductor layer therein. At least one self-aligned contact structure formed next to the metal gate conductor on the semiconductor substrate. As such, the cap layer and the spacer separate the self-aligned contact structure from directly contacting the metal gate conductor.
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Duane Morris LLP
Quach T. N.
Taiwan Semiconductor Manufacturing Company
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