Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2006-04-18
2006-04-18
Kim, Hong (Department: 2185)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S766000, C714S770000, C711S114000
Reexamination Certificate
active
07032125
ABSTRACT:
The present invention is a method and system for associating metadata with user data in a storage array in a manner that provides independence between metadata management and a storage controller's cache block size. Metadata may be associated with user data according to multiple fashions in order to provide a desired performance benefit. In one example, the metadata may be associated according to a segment basis to maximize random I/O performance and may be associated according to a stripe basis to maximize sequential I/O performance.
REFERENCES:
patent: 5390327 (1995-02-01), Lubbers et al.
patent: 5574851 (1996-11-01), Rathunde
patent: 5774643 (1998-06-01), Lubbers et al.
patent: 5826001 (1998-10-01), Lubbers et al.
patent: 6148368 (2000-11-01), DeKoning
patent: 6378038 (2002-04-01), Richardson et al.
patent: 6389432 (2002-05-01), Pothapragada et al.
patent: 6530004 (2003-03-01), King et al.
patent: 6675176 (2004-01-01), Shinkai et al.
patent: 6728922 (2004-04-01), Sundaram et al.
patent: 6742137 (2004-05-01), Frey, Jr.
patent: 6851082 (2005-02-01), Corbett
Delaney William P.
Holt Keith W.
Kim Hong
LSI Logic Corporation
Suiter - West - Swantz PC LLO
LandOfFree
Method for loosely coupling metadata and data in a storage... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for loosely coupling metadata and data in a storage..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for loosely coupling metadata and data in a storage... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3555027