Semiconductor device having diffusion barrier layer...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

Other Related Categories

C257SE27048

Type

Reexamination Certificate

Status

active

Patent number

07105885

Description

ABSTRACT:
A semiconductor device is provided which is capable of preventing a constitutional material of a diffusion barrier layer from diffusing into a bottom electrode during a high thermal process and of preventing an increase in contact resistance of a contact plug by suppressing mutual diffusions of the constitutional material of the diffusion barrier layer and the contact plug and a method for fabricating the same. The semiconductor device includes a bottom electrode of a capacitor connecting to a substrate through a contact plug; a first diffusion barrier layer disposed on the contact plug, wherein the first diffusion barrier contains Cr therein for preventing mutual diffusions between the bottom electrode and the contact plug; and a second diffusion barrier on the first diffusion barrier for preventing the Cr in the first diffusion layer from diffusing into the bottom electrode; a dielectric layer disposed on the bottom electrode and a top electrode disposed on the dielectric layer.

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patent: 6399521 (2002-06-01), Zhang et al.
patent: 2002/0096734 (2002-07-01), Natsume
patent: 2003/0077874 (2003-04-01), Hsu et al.
patent: 12-307071 (2000-11-01), None
patent: 2000-15240 (2000-03-01), None
patent: 2000-42447 (2000-07-01), None

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