Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-09-12
2006-09-12
Geyer, Scott B. (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27048
Reexamination Certificate
active
07105885
ABSTRACT:
A semiconductor device is provided which is capable of preventing a constitutional material of a diffusion barrier layer from diffusing into a bottom electrode during a high thermal process and of preventing an increase in contact resistance of a contact plug by suppressing mutual diffusions of the constitutional material of the diffusion barrier layer and the contact plug and a method for fabricating the same. The semiconductor device includes a bottom electrode of a capacitor connecting to a substrate through a contact plug; a first diffusion barrier layer disposed on the contact plug, wherein the first diffusion barrier contains Cr therein for preventing mutual diffusions between the bottom electrode and the contact plug; and a second diffusion barrier on the first diffusion barrier for preventing the Cr in the first diffusion layer from diffusing into the bottom electrode; a dielectric layer disposed on the bottom electrode and a top electrode disposed on the dielectric layer.
REFERENCES:
patent: 6090697 (2000-07-01), Xing et al.
patent: 6117725 (2000-09-01), Huang
patent: 6180974 (2001-01-01), Okutoh et al.
patent: 6190963 (2001-02-01), Zhang et al.
patent: 6288420 (2001-09-01), Zhang et al.
patent: 6320213 (2001-11-01), Kirlin et al.
patent: 6399521 (2002-06-01), Zhang et al.
patent: 2002/0096734 (2002-07-01), Natsume
patent: 2003/0077874 (2003-04-01), Hsu et al.
patent: 12-307071 (2000-11-01), None
patent: 2000-15240 (2000-03-01), None
patent: 2000-42447 (2000-07-01), None
Birch & Stewart Kolasch & Birch, LLP
Geyer Scott B.
Hynix / Semiconductor Inc.
LandOfFree
Semiconductor device having diffusion barrier layer... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device having diffusion barrier layer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having diffusion barrier layer... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3553657