Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-18
2006-07-18
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S116000, C716S116000
Reexamination Certificate
active
07080338
ABSTRACT:
A layout designing apparatus includes an input unit that receives an input of a frame having a boundary scan register, a placing unit that places an I/O macro to be connected to a signal terminal for propagating other signal than a test signal in an arbitrary I/O macro placement area of the frame input, a determining unit that determines whether a frame terminal at an arbitrary terminal position in the frame matches with at least one of a test terminal for propagating the test signal in the frame input and a signal terminal to be connected to the I/O macro placed, and a replacing unit that replaces, based on a result of determining by the determining unit, the I/O macro placed with either of a shared I/O macro and a test-only I/O macro.
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Abe Koji
Oosaki Seiko
Watanabe Hitoshi
Dinh Paul
Fujitsu Limited
Memula Suresh
Staas & Halsey , LLP
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