Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-07-11
2006-07-11
Tran, Minhloan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S330000, C257S329000, C257S328000, C257S316000, C257S401000
Reexamination Certificate
active
07075148
ABSTRACT:
The invention relates to a semiconductor memory having a multiplicity of memory cells, each of the memory cells having N (e.g., four) vertical memory transistors with trapping layers. Higher contact regions are formed in higher semiconductor regions extending obliquely with respect to the rows and columns of the cell array, the gate electrode generally being led to the step side areas of the higher semiconductor region. A storage density of 1-2F2per bit can thus be achieved.
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Hofmann Franz
Landgraf Erhard
Luyken Richard Johannes
Schulz Thomas
Specht Michael
Infineon - Technologies AG
Mandala Jr. Victor A.
Patterson & Sheridan L.L.P.
Tran Minhloan
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