Method and system for drying semiconductor wafers in a spin...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S906000

Reexamination Certificate

active

06992023

ABSTRACT:
The invention provides methods and apparatus for drying the backside of semiconductor wafers in a spin-coating environment. Solvent is evaporatively dried from a semiconductor wafer held in a spin mechanism. The undried wafer is sprayed with one or more jets of pressurized gas from gas ports disposed about the spin mechanism.

REFERENCES:
patent: 5518542 (1996-05-01), Matsukawa et al.
patent: 5605867 (1997-02-01), Sato et al.
patent: 5658615 (1997-08-01), Hasebe et al.
patent: 5939139 (1999-08-01), Fujimoto
patent: 5964594 (1999-10-01), Saitoh et al.
patent: 6440864 (2002-08-01), Kropewnicki et al.
patent: 6676757 (2004-01-01), Kitano et al.
patent: 6706334 (2004-03-01), Kobayashi et al.
patent: 6748961 (2004-06-01), Treur

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for drying semiconductor wafers in a spin... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for drying semiconductor wafers in a spin..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for drying semiconductor wafers in a spin... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3535933

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.