Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-03-07
2006-03-07
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S711000, C438S714000, C438S733000, C438S771000, C438S788000
Reexamination Certificate
active
07008878
ABSTRACT:
A method for dry etching a dielectric layer including providing a substrate; forming at least one overlying dielectric layer over the substrate; subjecting the at least one overlying layer to a plasma oxidizing process; and, subjecting the at least one overlying layer to a plasma etching process.
REFERENCES:
patent: 5116460 (1992-05-01), Bukhman
patent: 6380056 (2002-04-01), Shue et al.
patent: 6479402 (2002-11-01), Yang et al.
Chiu Yuan-Hung
Hsu Ju-Wang
Tao Hun-Jan
Duong Khanh
Taiwan Semiconductor Manufacturing Co. Ltd.
Trinh Michael
Tung & Associates
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