System for and method of assessing chip acceptability and...

Details System for and method of assessing chip acceptability and... System for and method of assessing chip acceptability and...

2006-01-24

2006-01-24

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06989684

ABSTRACT:
The present invention includes a method for testing a chip, comprising the steps of measuring power drawn by the chip, calculating a test frequency using the measured power drawn by the chip, and determining performance of the chip at the calculated test frequency. The present invention also includes a system for testing a chip including a first sensor to measure power drawn by the chip, a controller to calculate a test frequency using the measured power drawn by the chip, and a second sensor to measure speed of the chip at the calculated test frequency.

REFERENCES:
patent: 5130645 (1992-07-01), Levy
patent: 6067651 (2000-05-01), Rohrbaugh et al.
patent: 6351134 (2002-02-01), Leas et al.
patent: 6370676 (2002-04-01), Hayashi et al.

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