Trench capacitor and method for fabricating the trench...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S304000

Reexamination Certificate

active

06987295

ABSTRACT:
A trench capacitor for use in a DRAM memory cell contains a lower capacitor electrode, a storage dielectric, and an upper capacitor electrode, which are at least partially disposed in a trench. The lower capacitor electrode adjoins, in a lower trench region, a wall of the trench, while in the upper trench region there is a spacer layer that adjoins a wall of the trench and is made from an insulating material. The upper electrode contains at least three layers, a first layer disposed in the trench on the storage dielectric and containing doped polysilicon, a second layer disposed on the first layer and containing metal-silicide, and a third layer disposed on the second layer and containing doped polysilicon. The layers of the upper electrode in each case extending along the walls and the base of the trench up to at least the upper edge of the spacer layer.

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patent: 2004/0036102 (2004-02-01), Sell et al.
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patent: 01/17014 (2001-03-01), None
The American Heritage Dictionary, Second College Edition, p. 867, plain meaning definition of “on”, 1982.
Yamada, K. et al.: “Deep-Trenched Capacitor Technology for 4 Mega Bit Dynamic RAM”, IEEE, 1985, pp. 702-705.

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