Two-dimensional scatter plot technique for defect inspection

Details Two-dimensional scatter plot technique for defect inspection Two-dimensional scatter plot technique for defect inspection

2005-06-28

2005-06-28

Couso, Yon J. (Department: 2625)

Image analysis

Applications

Manufacturing or product inspection

C382S151000, C382S169000

Reexamination Certificate

active

06912304

ABSTRACT:
A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.

REFERENCES:
patent: 4511929 (1985-04-01), Maeda et al.
patent: 4783826 (1988-11-01), Koso
patent: 4823194 (1989-04-01), Mishima et al.
patent: 4886958 (1989-12-01), Merryman et al.
patent: 5033096 (1991-07-01), Morrison et al.
patent: RE33894 (1992-04-01), Bradley
patent: 5291535 (1994-03-01), Baker et al.
patent: 5506793 (1996-04-01), Straayer et al.
patent: 5515453 (1996-05-01), Hennessey et al.
patent: 5568563 (1996-10-01), Tanaka et al.
patent: 5592236 (1997-01-01), Rosenbaum et al.
patent: 5638465 (1997-06-01), Sano et al.
patent: 5808735 (1998-09-01), Lee et al.
patent: 5943441 (1999-08-01), Michael
patent: 6178257 (2001-01-01), Alumot et al.
patent: 6252981 (2001-06-01), Guest et al.
patent: 6256093 (2001-07-01), Ravid et al.
patent: 6282309 (2001-08-01), Emery
patent: 6285397 (2001-09-01), Webb et al.
patent: 6288782 (2001-09-01), Worster et al.
patent: 6512849 (2003-01-01), Yair et al.
patent: 6539106 (2003-03-01), Gallarda et al.
Hanaizumi, H. et al.: “An Automatic Registration Method For Remotely Sensed Multispectral Images By Using Spatial Correlation Between Local Triangles” Proceedings of the International Geoscience and Remote Sensing Symposium. (IGARSS), US, New York, IEEE, vol. SYMP. 12, Jul. 10, 1989, pp. 1287-1290, XP000139269.

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