Semiconductor memory device and test method thereof

Details Semiconductor memory device and test method thereof Semiconductor memory device and test method thereof

2005-06-21

2005-06-21

Tran, M. (Department: 2827)

Static information storage and retrieval

Interconnection arrangements

C365S201000, C365S230030

Reexamination Certificate

active

06909624

ABSTRACT:
In recent system LSIs, a plurality of RAMs differing in capacity and in bit width have come to be mounted on a single chip according to the needs on the system side. However, when testing the plurality of RAMs, if the RAMs differ in capacity, they cannot be tested using the same test pattern (for example, HALF-MARCH) even if a special pin is provided for each RAM, because X, Y address mapping differs between the different RAMs; accordingly, the test has to be performed by dividing the RAMs into groups each consisting of RAMs having the same memory space, and this has lead to increased test time. An external address signal and a test-only address signal are provided as RAM control signals and, in the latter case, the number of X, Y addresses in each of the RAMs4and5is set equal to that of the largest capacity RAM3within the same chip, thereby making the X, Y address mapping the same for all the RAMs3to5.

REFERENCES:
patent: 4654787 (1987-03-01), Finnell et al.
patent: 4734884 (1988-03-01), Kohno et al.
patent: 5222066 (1993-06-01), Grula et al.
patent: 5237672 (1993-08-01), Ing-Simmons et al.
patent: 5436910 (1995-07-01), Takeshima et al.
patent: 5517253 (1996-05-01), De Lange
patent: 5930814 (1999-07-01), Lepejian et al.
patent: 6343378 (2002-01-01), Moroda
patent: 6360342 (2002-03-01), Lee et al.
patent: 6662285 (2003-12-01), Douglass et al.
patent: 6714903 (2004-03-01), Chu et al.

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