Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-20
2005-12-20
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C326S015000, C326S021000, C326S101000, C257S635000, C257S649000
Reexamination Certificate
active
06978434
ABSTRACT:
A wiring structure of a semiconductor device, includes a wiring layer formed on an insulating film, a width (W) of each wire in the wiring layer and a thickness (H) of the insulating film satisfying “W/H<1” a length (L) of each wiring in the wiring layer being equal to or longer than 1 mm.
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Shigyo Naoyuki
Yamaguchi Tetsuya
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Kik Phallaka
Smith Matthew
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