Semiconductor memory test device

Details Semiconductor memory test device Semiconductor memory test device

2005-11-22

2005-11-22

Hoang, Huan (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S230060, C365S205000

Reexamination Certificate

active

06967880

ABSTRACT:
A semiconductor memory test device is capable of reducing the test time and increasing test reliability by applying an effective stress in a burn-in level or a wafer level. The semiconductor memory test device controls a sense amplifier using an additional sense amplifier driving signal when a 2rb pattern stress is applied. Therefore, the semiconductor memory test device applies a uniform stress by applying the constant supply voltage to a cell corresponding to the entire wordlines.

REFERENCES:
patent: 5381373 (1995-01-01), Ohsawa
patent: 5638331 (1997-06-01), Cha et al.
patent: 5852581 (1998-12-01), Beffa et al.
patent: 5886944 (1999-03-01), Ahn
patent: 5898629 (1999-04-01), Beffa et al.
patent: 6031773 (2000-02-01), Taylor
patent: 6055199 (2000-04-01), Hamade et al.
patent: 6233185 (2001-05-01), Beffa et al.
patent: 6266286 (2001-07-01), Cho et al.
patent: 6551846 (2003-04-01), Furutani et al.
patent: 60157250 (1985-08-01), None
patent: 4163785 (1992-06-01), None
patent: 5325547 (1994-12-01), None

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