Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-13
2005-12-13
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06976234
ABSTRACT:
Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.
REFERENCES:
patent: 4681449 (1987-07-01), Bloom et al.
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 5497009 (1996-03-01), Torikoshi et al.
patent: 5508610 (1996-04-01), Feeney
patent: 5631571 (1997-05-01), Spaziani
patent: 5640539 (1997-06-01), Goishi et al.
patent: 5663967 (1997-09-01), Prasad et al.
patent: 5682888 (1997-11-01), Olson et al.
patent: 5683179 (1997-11-01), Lowry
patent: 5721688 (1998-02-01), Bramwell
patent: 5872360 (1999-02-01), Paniccia et al.
patent: 5905577 (1999-05-01), Wilsher et al.
patent: 5940545 (1999-08-01), Kash et al.
patent: 5949900 (1999-09-01), Nakamura et al.
patent: 6107107 (2000-08-01), Bruce et al.
patent: 6184696 (2001-02-01), White
patent: 6331782 (2001-12-01), White
patent: 6621275 (2003-09-01), Cotton
patent: 6686755 (2004-02-01), White
patent: 6859031 (2005-02-01), Pakdaman et al.
patent: 407320173 (1995-12-01), None
K. Soumyanath et al., “Accurate On-Chip Interconnect Evaluation: A Time-Domain Technique,” IEEE Journal of Solid-State Circuits, vol. 34, No. 5, May 1999, pp 623-631.
Stefan Rusu et al., “Backside Infrared Probing for Static Voltage Drop and Dynamic Timing Measurements,” 2001 IEEE International Solid-State Circuit Conference, Feb. 7, 2002. Digest of Technical Papers. ISSCC. 2001 IEEE International, pp 276-277, 454.
J.A. Kash, J.C. Tsang, “Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence” IEEE Electron Device Letters, vol. 18, No. 7, p. 330-332, Jul. 1997.
Ali Muhtaroglu, et al. “On-Die Droop Detector for Analog Sensing of Power Supply Noise” IEEE Journal of Solid-State Circuits, vol. 39 No. 4, Apr 2004, p. 651-660.
Credence Systems Corporation
Do Thuan
Sughrue & Mion, PLLC
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