Optics: measuring and testing – Position or displacement
Reexamination Certificate
2005-08-02
2005-08-02
Pham, Hao Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
C356S625000, C356S636000, C250S559360
Reexamination Certificate
active
06924900
ABSTRACT:
The present invention concerns a method and a microscope for detection of a specimen, having a light source that illuminates the specimen and an imaging system that images the specimen onto a detector. For purposes of an increase in the effective resolution capability of the imaging system that goes beyond the limit of the resolution capability defined by the properties of the imaging system, the method and the microscope according to the present invention for detection of a specimen are characterized in that the specimen is detected repeatedly with a different resolution of the imaging system in each case; and that in order to determine an optimized resolution capability, the detected image data are conveyed to a statistical and/or numerical analysis operation.
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Crowell & Moring LLP
Leica Microsystems Semiconductor GmbH
Pham Hao Q.
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