Memory LSI failure analysis apparatus and analysis method...

Details Memory LSI failure analysis apparatus and analysis method... Memory LSI failure analysis apparatus and analysis method...

2005-02-08

2005-02-08

DeCady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000, C702S180000

Reexamination Certificate

active

06854080

ABSTRACT:
Provided are a device, method and storage medium, which, when a memory LSI defect analysis apparatus is used as a monitoring device to estimate reductions in yield, automatically interprets results, and calculates the period of distribution patterns and the mix rate of regular patterned defects. The total defect number of bits is found, and the factor f, is selected. The value of expected value functions, T(f), for the selected f is found, and if it is decided that regularly patterned defects are included, then regular pattern defect mix rate function MR(f) is calculated from number of bits, factor f, and the value of estimated value function T(f). If it is decided that it does not contain regularly patterned defects the regular patterned defect mix rate function MR(f) is assumed to be zero; and it is confirmed whether or not MR(f) has been found for every f.

REFERENCES:
patent: 5530805 (1996-06-01), Tanabe
patent: 5831989 (1998-11-01), Fujisaki
patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 6016562 (2000-01-01), Miyazaki et al.
patent: 6034905 (2000-03-01), Suzuki et al.
patent: 6493654 (2002-12-01), Sugimoto
patent: 6564346 (2003-05-01), Vollrath et al.
patent: 6625766 (2003-09-01), Oh et al.
patent: 2629523 (1997-04-01), None
patent: 11-186354 (1999-09-01), None
patent: 11-306793 (1999-11-01), None
patent: 2000-21195 (2000-01-01), None
patent: 2000-187062 (2000-07-01), None
patent: 2000-200814 (2000-11-01), None
patent: 2000-321333 (2000-11-01), None

Affiliated with

Also associated with

Rating

Memory LSI failure analysis apparatus and analysis method... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory LSI failure analysis apparatus and analysis method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory LSI failure analysis apparatus and analysis method... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3492789