Method for producing electrical through hole interconnects...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S669000, C438S672000, C438S673000

Reexamination Certificate

active

06908856

ABSTRACT:
The invention relates to a method for the fabrication of a device comprising electrical through hole interconnects. In one embodiment, the method comprises anisotropical dry etching of a patternable dielectric material within a substrate hole. One aspect of the invention provides a novel method for producing via or through hole interconnects between microelectronic elements, which is relatively easy to perform and can be applied relatively cheaply compared to the state of the art. The method should, for instance, be applicable in thin chip technology as MCM (Multi Chip Module) and system in a package (SIP) technology.

REFERENCES:
patent: 6608371 (2003-08-01), Kurashima et al.
patent: 6670269 (2003-12-01), Mashino
patent: 2001/0001292 (2001-05-01), Bertin et al.
patent: 2002/0017710 (2002-02-01), Kurashima et al.
patent: 2002/0027293 (2002-03-01), Hoshino
patent: 2002/0048916 (2002-04-01), Yanagida
patent: 1 199 744 (2002-04-01), None
patent: 61-248534 (1986-11-01), None
patent: 11 251316 (1999-09-01), None
patent: 2001 015654 (2001-01-01), None

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