Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-08-16
2005-08-16
Nguyen, Ha Tran (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S647000, C438S653000, C438S681000, C438S684000, C438S685000
Reexamination Certificate
active
06930039
ABSTRACT:
This invention is a process for forming an effective titanium nitride barrier layer between the upper surface of a polysilicon plug formed in a thick dielectric layer and a platinum lower capacitor plate in a dynamic random access memory which is being fabricated on a silicon wafer.
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IBM Technical Disclosure Bulletin, vol. 35, No. 5, Oct. 1992 (Collimated Sputtering).
Fazan Pierre C.
Schuele Paul J.
Micro)n Technology, Inc.
Nguyen Ha Tran
TraskBritt
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