Method for forming a dielectric film

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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Details

Other Related Categories

C438S704000, C438S724000, C438S734000, C438S757000, C438S785000

Type

Reexamination Certificate

Status

active

Patent number

06852646

Description

ABSTRACT:
A method for forming a dielectric film in a PDP includes the steps of: reducing the ambient pressure of an insulating film including a dielectric material before the ambient temperature reaches the reaction temperature of the dielectric material; introducing heated gas to increase the ambient pressure up to the atmospheric pressure while maintaining the ambient temperature at the reaction temperature; and lowering the ambient temperature down to the solidifying temperature of the insulating film while maintaining the atmospheric ambient pressure.

REFERENCES:
patent: 3982887 (1976-09-01), Kendziora et al.
patent: 5266027 (1993-11-01), Kuwayama
patent: 6582972 (2003-06-01), Joshi et al.
patent: 0 908 928 (1999-04-01), None
patent: 08017337 (1996-01-01), None
patent: 08-017337 (1996-01-01), None
patent: 11-108559 (1999-04-01), None
patent: 2000040470 (2000-02-01), None

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