Rotating gripper wafer flipper

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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C324S765010, C324S754090

Reexamination Certificate

active

06909276

ABSTRACT:
A method for fabricating semiconductor wafers. Specifically, an arm which is constructed to hold a wafer, is mounted on a rotational device to provide a user with the means of inspecting a wafer in any position without having to physically touch the wafer or move the wafer to another inspection station. The arm provides rotation about an axis parallel to the surface of the wafer, as well as rotation about an axis run which is perpendicular to the surface of the wafer and extends through the axial center of the wafer.

REFERENCES:
patent: 5052884 (1991-10-01), Igari
patent: 5518542 (1996-05-01), Matsukawa et al.
patent: 5549444 (1996-08-01), Dubuit
patent: 5700046 (1997-12-01), Van Doren et al.
patent: 5868857 (1999-02-01), Moinpour et al.
patent: 5947802 (1999-09-01), Zhang et al.
patent: 6168683 (2001-01-01), Cesna
patent: 6186873 (2001-02-01), Becker et al.
patent: 6283701 (2001-09-01), Sundar et al.
patent: 6350097 (2002-02-01), Mitchell et al.
patent: 6606154 (2003-08-01), Oda
Ultracision, Inc. “Inspection Gimbal Assembly” Mar. 19, 1999.
Olympus “Inspection and Transfer System” 1999.
Nikon “Inspection and Transfer System” 1999.
Ontrak Systems “Synergy Performa” Mar. 19, 1999.
Ontrak Systems “Synergy Integra” Mar. 19, 1999.

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