Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-11-01
2005-11-01
Nguyen, Ha Tran (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S630000, C438S637000, C438S649000, C438S586000, C438S664000
Reexamination Certificate
active
06960525
ABSTRACT:
A method of forming a metal plug. First, a dielectric layer is formed on a substrate. Next, a patterned hard mask is formed on the dielectric layer. The dielectric layer is etched through the patterned hard mask to form a contact hole in the dielectric layer so as to expose parts of the substrate. An isolated layer is formed on the patterned hard mask. A barrier is then formed conformally on the isolated layer and the exposed substrate of the contact hole. A metal layer is formed to fill the contact hole and cover the barrier. A thermal treatment is performed to form a silicide between the barrier layer and the substrate. Finally, parts of the metal layer, barrier, isolated layer, and patterned hard mask are removed. The metal plug with a planar surface is thus formed in the contact hole.
REFERENCES:
patent: 6461963 (2002-10-01), Givens et al.
Chen Yi-Nan
Mao Hui-Min
Nanya Technology Corporation
Nguyen Ha Tran
Quintero Law Office
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