Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-05-17
2005-05-17
Hoang, Huan (Department: 2818)
Static information storage and retrieval
Read/write circuit
Testing
C365S158000
Reexamination Certificate
active
06894938
ABSTRACT:
A system and method of calibrating a read circuit in a magnetic memory is disclosed. In one embodiment, the method includes measuring a calibration value. A large error calibration is performed if the calibration value is within a maximum range. A small error calibration is performed if the calibration value is within a minimum range. The method may include performing a first read operation on the magnetic memory, and performing a second read operation on the magnetic memory.
REFERENCES:
patent: 6188615 (2001-02-01), Perner et al.
patent: 6262625 (2001-07-01), Perner et al.
patent: 20030023928 (2003-01-01), Jedwab et al.
patent: 20040062104 (2004-04-01), Muller et al.
Hilton Richard L.
Perner Frederick A.
Smith Kenneth Kay
Hewlett--Packard Development Company, L.P.
Hoang Huan
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