Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2005-10-11
2005-10-11
Phan, Trong (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S063000
Reexamination Certificate
active
06954394
ABSTRACT:
The preferred embodiments described herein relate to an integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions. In one preferred embodiment, a memory array is provided comprising a plurality of memory cells arranged in L layers stacked vertically above one another in a single integrated circuit. A memory cell layer in the memory array is selected, and one of N sets of memory-cell-layer-dependent writing conditions and/or one of K sets of memory-cell-layer-dependent reading conditions is selected based on the selected memory cell layer. In another preferred embodiment, a temperature of an integrated circuit is measured, and a set of writing conditions and/or a set of reading conditions is selected based on the measured temperature. Other preferred embodiments are provided, and each of the preferred embodiments can be used alone or in combination with one another.
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Cleeves James M.
Johnson Mark G.
Kleveland Bendik
Knall N. Johan
Scheuerlein Roy E.
Brinks Hofer Gilson & Lione
Matrix Semiconductor Inc.
Phan Trong
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