Semiconductor integrated circuit device capable of tuning of...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S145000, C365S171000, C365S189070, C365S189090, C365S191000

Reexamination Certificate

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06928010

ABSTRACT:
A semiconductor integrated circuit device includes a plurality of internal circuits, an internal power supply potential generating circuit for converting a level of an external power supply potential to supply an internal power supply potential at a level according to a level set signal, a control portion for successively applying said plurality of level set signals to each internal potential generating circuit for successively producing a plurality of internal potentials at different levels in a test operation, and a measuring circuit for making a comparison between each internal potential and a reference potential, and holding information representing results of the comparison.

REFERENCES:
patent: 6549480 (2003-04-01), Hosogane et al.
patent: 7-140208 (1995-06-01), None

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