Semiconductor device and portable electronic apparatus

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S368000, C257S369000, C257S371000, C257S374000, C257S506000, C257S392000, C257S314000, C257S355000, C257S341000, C257S401000, C257S296000, C257S390000, C257S342000, C257S391000, C257S510000, C438S199000, C438S221000, C438S223000

Reexamination Certificate

active

06969893

ABSTRACT:
There is provided a semiconductor device of low power consumption and high reliability having DTMOS' and substrate-bias variable transistors, and portable electronic equipment using the semiconductor device. On a semiconductor substrate (11), trilayer well regions (12, 14, 16; 13, 15, 16) are formed, and DTMOS' (29, 30) and substrate-bias variable transistors (27, 28) are provided in the shallow well regions (16, 17). Large-width device isolation regions (181, 182, 183) are provided at boundaries forming PNP, NPN or NPNP structures, where a small-width device isolation region (18) is provided on condition that well regions on both sides are of an identical conductive type. Thus, a plurality of well regions of individual conductive types where substrate-bias variable transistors (27, 28) of individual conductive types are provided can be made electrically independent of one another, allowing the power consumption to be reduced. Besides, the latch-up phenomenon can be suppressed.

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patent: 6255704 (2001-07-01), Iwata et al.
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Wolf, “Silicon Processing for VLSI Era, vol. 3— Subsmicron MOSFET,” 1990, Lattice Press, p. 367-383.
Kakimoto et al., IEEE, pp. 459-462 (1996).

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