Liquid crystal display for preventing galvanic phenomenon

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C438S151000, C438S722000

Reexamination Certificate

active

06867076

ABSTRACT:
A thin film transistor having a source/drain electrode on an insulating substrate is provided with a metal oxide layer interposed between a source/drain electrode and a metal connecting line. The formation of the metal oxide layer prevents the occurrence of the galvanic phenomenon.

REFERENCES:
patent: 5422921 (1995-06-01), Chiba
patent: 5434439 (1995-07-01), Ajika et al.
patent: 5847410 (1998-12-01), Nakajima
patent: 8-062628 (1996-03-01), None
patent: 9-203911 (1997-08-01), None

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