Process and manufacturing tool architecture for use in the...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S652000, C438S653000, C438S654000, C438S655000, C438S680000

Reexamination Certificate

active

06887789

ABSTRACT:
A process for providing one or more protected copper elements on a surface of a workpiece is set forth. In accordance with the process, a barrier layer is applied to the workpiece. If the barrier layer is not suitable as a seed layer for subsequent electroplating processes, a separate seed layer is applied over the surface of the barrier layer. One or more copper elements are then electroplated on selected portions of the seed layer or, if suitable, the barrier layer. If used, the seed layer is then substantially removed. At least a portion of a surface of the barrier layer is rendered unplatable while leaving the copper elements suitable for electroplating. A protective layer is then electroplated onto surfaces of the one or more copper elements.

REFERENCES:
patent: 5827604 (1998-10-01), Uno et al.
patent: 5913144 (1999-06-01), Nguyen et al.
patent: 6420262 (2002-07-01), Farrar

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process and manufacturing tool architecture for use in the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process and manufacturing tool architecture for use in the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and manufacturing tool architecture for use in the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3440663

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.