Methods for predicting board test coverage

Details Methods for predicting board test coverage Methods for predicting board test coverage

2005-05-17

2005-05-17

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

06895565

ABSTRACT:
Disclosed are methods for predicting board test coverage. In one method, board test coverage is predicted by enumerating potentially defective properties for a board design; determining how each of a number of potential test technologies could be applied to the board design; and predicting board test coverage for one or more combinations of the potential test technologies. Board test coverage is predicted for a combination of potential test technologies by, for each potentially defective property enumerated, generating a property score that is indicative of whether a potential test technology could test for the potentially defective property; and combining property scores to predict board test coverage for the combination of potential test technologies.

REFERENCES:
patent: 5136686 (1992-08-01), Koza
patent: 5271090 (1993-12-01), Boser
patent: 5570375 (1996-10-01), Tsai et al.
patent: 5995652 (1999-11-01), Chiu et al.
patent: 6091846 (2000-07-01), Lin et al.
patent: 6167390 (2000-12-01), Brady et al.
patent: 6279146 (2001-08-01), Evans et al.
patent: 6400996 (2002-06-01), Hoffberg et al.
patent: 20020170000 (2002-11-01), Gorodetsky et al.
patent: 20030018631 (2003-01-01), Lipson et al.
patent: 20030041286 (2003-02-01), Boorom et al.
Kenneth P. Parker, et al., “Methods and Apparatus for Characterizing Board Test Coverage”, U.S. Appl. No. 10/233,767, 42 pages of specification including claims and abstract and five sheets of formal drawings (Figs. 1-11).
Kenneth P. Parker, et al., “Methods and Apparatus for Characterizing Board Test Coverage”, U.S. Appl. No. 10/233,768, 49 pages of specification including claims and abstract and five sheets of formal drawings (Figs. 1-13).
K.P. Parker, “ITC 1996 Lecture Series on Unpowered Opens Testing,” Proceeding, International Test Conference, 1996, p. 924.
E.O. Scholtzhauer and R.J. Balzer, “Real-World Board Test Effectiveness: What Does It Mean When the Board Passes?”, Proceedings, International Test Conference, 1987, pp. 792-797.
M.V. Tegethoff, K.P Parker and K. Lee, “Opens Board Test Coverage: When is 99% Really 40%?”, International Test Conference, Jun. 1996, pp. 333-339.
U.S. Patent Application of Kenneth P. Parker, et al., “Methods and Apparatus for Characterizing Board Test Coverage”, U.S. Appl. No. 10/233,768 filed Sep. 1, 2002.

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