Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-31
2005-05-31
Wojciechowicz, Edward (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257S347000, C257S350000, C257S052000, C257S083000, C257S088000
Reexamination Certificate
active
06900499
ABSTRACT:
A non-volatile memory comprising a semiconductor active layer provided on an insulating substrate, an insulating film provided on the semiconductor active layer, a floating gate electrode provided on the insulating film, an anodic oxidized film obtained by anodic oxidation of the floating gate electrode, and a control gate electrode provided in contact with the anodic oxidized film, and a semiconductor device, particularly a liquid crystal display device comprising the non-volatile memory.
REFERENCES:
patent: 4065781 (1977-12-01), Gutknecht
patent: 4394688 (1983-07-01), Lida et al.
patent: 5260797 (1993-11-01), Muraji et al.
patent: 5452019 (1995-09-01), Fukuda et al.
patent: 5469365 (1995-11-01), Diekema et al.
patent: 5481317 (1996-01-01), Hieda
patent: 5539459 (1996-07-01), Bullitt et al.
patent: 5643826 (1997-07-01), Ohtani et al.
patent: 5648277 (1997-07-01), Zhang et al.
patent: 5666159 (1997-09-01), Parulski et al.
patent: 5705829 (1998-01-01), Miyanaga et al.
patent: 5793344 (1998-08-01), Koyama
patent: 5895935 (1999-04-01), Yamazaki et al.
patent: 5923962 (1999-07-01), Ohtani et al.
patent: 5926562 (1999-07-01), Hyodo et al.
patent: 5933199 (1999-08-01), Yoon
patent: 5982427 (1999-11-01), Hunt et al.
patent: 5982462 (1999-11-01), Nakano et al.
patent: 6004847 (1999-12-01), Clementi et al.
patent: 6433382 (2002-08-01), Orlowski et al.
patent: 7-130652 (1995-05-01), None
patent: 7-135318 (1995-05-01), None
patent: 7-321339 (1995-12-01), None
patent: 8-078329 (1996-03-01), None
patent: 10-294280 (1998-11-01), None
patent: 11-345767 (1999-12-01), None
patent: 11-354442 (1999-12-01), None
Shimokawa, R. et al, “Characterization of High-Efficiency Cast-Si Solar Cell Wafers by MBIC Measurement,” Japanese Journal of Applied Physics, vol. 27, No. 5, pp. 751-758, May, 1988.
U.S. Appl. No. 09/144,538 (pending) to Yamazaki et al, including specification, claims, abstract and drawings.
Koyama Jun
Yamazaki Shunpei
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Semiconductor Energy Laboratory Co,. Ltd.
Wojciechowicz Edward
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