Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2005-09-20
2005-09-20
Pezzuto, Helen L. (Department: 1713)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S325000, C430S326000, C430S905000, C430S910000, C526S243000, C526S244000, C526S251000, C526S281000, C526S287000
Reexamination Certificate
active
06946235
ABSTRACT:
A resist composition comprising a polymer containing vinyl sulfonate units having fluorinated hydrophilic groups as a base resin has excellent transparency, substrate adhesion and developer penetrability as well as plasma etching resistance, and is suited for lithographic microprocessing.
REFERENCES:
patent: 4491628 (1985-01-01), Ito et al.
patent: 5310619 (1994-05-01), Crivello et al.
patent: 6576392 (2003-06-01), Sato et al.
patent: 63-27829 (1988-02-01), None
patent: 2-27660 (1990-06-01), None
patent: 5-158239 (1993-06-01), None
patent: 5-232706 (1993-09-01), None
patent: 5-249662 (1993-09-01), None
patent: 5-249683 (1993-09-01), None
patent: 5-257282 (1993-10-01), None
patent: 5-289322 (1993-11-01), None
patent: 5-289340 (1993-11-01), None
patent: 06-11837 (1994-01-01), None
patent: 9-73173 (1997-03-01), None
patent: 09-197661 (1997-07-01), None
patent: 9-230595 (1997-09-01), None
patent: 10-10739 (1998-01-01), None
patent: 11-327145 (1999-11-01), None
patent: 11-338150 (1999-12-01), None
patent: 2000-47385 (2000-02-01), None
patent: 2000-275841 (2000-06-01), None
patent: 2000-275838 (2000-10-01), None
patent: 2000-275840 (2000-10-01), None
patent: WO 97/33198 (1997-09-01), None
Shirai et al. Journal of Photopolymer Science and Technology (1998), 11(4), 641-644.
Fujigaya et al. Journal of Photopolymer Science and Technology (2002), 15(4), 643-654.
Endo Masayuki
Harada Yuji
Hatakeyama Jun
Kawai Yoshio
Kishimura Shinji
Central Glass Co. Ltd.
Matsushita Electric - Industrial Co., Ltd.
Pezzuto Helen L.
Shin-Etsu Chemical Co. , Ltd.
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