Polymers, resist compositions and patterning process

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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Details

C430S325000, C430S326000, C430S905000, C430S910000, C526S243000, C526S244000, C526S251000, C526S281000, C526S287000

Reexamination Certificate

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06946235

ABSTRACT:
A resist composition comprising a polymer containing vinyl sulfonate units having fluorinated hydrophilic groups as a base resin has excellent transparency, substrate adhesion and developer penetrability as well as plasma etching resistance, and is suited for lithographic microprocessing.

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