Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate
2005-01-04
2005-01-04
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
C438S682000
Reexamination Certificate
active
06838366
ABSTRACT:
MOS transistors and a methods for manufacturing the same are described. In one such MOS transistor, source and drain regions12are formed in an element region on an Si substrate11, and a gate electrode14including silicide is formed through a gate oxide film13over a channel region between the source and drain regions12. The gate electrode14is formed such that it includes a polysilicon gate electrode14and silicide142on an upper portion thereof. At least a thickness of and metal to be contained in the silicide142on the gate electrode14are selected regardless of silicide121provided over the source and drain regions12. The thickness of the silicide142provided over the gate electrode14may be greater than the thickness of the silicide121provided over the source and drain regions12.
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Estrada Michelle
Fourson George
Konrad Raynes & Victor LLP
Raynes Alan S.
Seiko Epson Corporation
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