Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Patent
1994-07-22
1997-04-22
Fourson, George
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Total dielectric isolation
438975, 438666, 438430, H01L 21302
Patent
active
056228902
ABSTRACT:
A contact region for a trench in a semiconductor device and a method for electrically contacting the conductive material in a trench that is too narrow for conventional electrical contacts may include a contact region in which the trench is divided into two or more trench sections, each section having the same narrow width as the undivided trench. The two or more trench sections are separated by one or more islands that are isolated from the semiconductor device. An aperture through the material above the contact region provides access for electrically contacting the conductive material in the trench sections.
REFERENCES:
patent: 4845051 (1989-07-01), Cogan et al.
patent: 5034346 (1991-07-01), Alter et al.
patent: 5057895 (1991-10-01), Beasom
patent: 5196373 (1993-03-01), Beasom
patent: 5248894 (1993-09-01), Beasom
patent: 5275974 (1994-01-01), Ellul et al.
Beasom James D.
Woodbury Dustin A.
Bilodeau Thomas G.
Fourson George
Harris Corporation
LandOfFree
Method of making contact regions for narrow trenches in semicond does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making contact regions for narrow trenches in semicond, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making contact regions for narrow trenches in semicond will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-341252