Method of obtaining a particle-optical image of a sample in...

Radiant energy – Inspection of solids or liquids by charged particles – Methods

Reexamination Certificate

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C250S309000, C250S310000, C250S443100

Reexamination Certificate

active

06888136

ABSTRACT:
In relatively thick samples for electron microscopy imaging, details of interest are often located in the bulk of the sample, so that they cannot be directly imaged in the form of a SEM image. According to the invention, so as to expose the cross-section containing the details of interest, the frozen sample is subjected to ion milling, in such a manner that the desired cross-section is exposed. Thereafter, the exposed cross-section is further eroded in a controlled manner via sublimation, whereby the detail of interest is approached in a very accurate manner, and its fine details become visible. Hereafter, the finally desired SEM image can be made. By repetition of this process, a large number of successive cross-sections can be imaged, so that a spatial representation of the sample is obtained.

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Scale-Space Signatures for the Delection of Clustered Microcalcifications In Digital Mammograms, IEEE Transactions on Medical Imaging vol. 18, No. 9, Sep. 1999, pp. 774-786.

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