Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-04-19
2005-04-19
Eckert, George (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S313000, C257S314000, C257S348000
Reexamination Certificate
active
06882008
ABSTRACT:
A semiconductor integrated circuit device comprises a semiconductor substrate; an insulating layer formed on the semiconductor substrate; a semiconductor layer insulated from the semiconductor substrate by the insulating layer; source regions of a first conduction type and drain regions of the first conduction type both formed in the semiconductor layer; body regions of a second conduction type formed in the semiconductor layer between the source regions and the drain regions to store data by accumulating or releasing an electric charge; word lines formed on the body regions in electrical isolation from the body regions to extend in a first direction; bit lines connected to the drain regions and extending in a direction different from the first direction; and buried wirings formed in the insulating layer in electrical isolation from the semiconductor substrate and the semiconductor layer, said buried wirings extending in parallel with the bit lines.
REFERENCES:
patent: 6538916 (2003-03-01), Ohsawa
patent: 6617651 (2003-09-01), Ohsawa
patent: 6621725 (2003-09-01), Ohsawa
patent: 6825524 (2004-11-01), Ikehashi et al.
patent: 20040058506 (2004-03-01), Fukuzumi
patent: 2002-246571 (2002-08-01), None
Charles Kuo, et al., “A Capacitorless Double-Gate DRAM Cell Design for High Density Applications”, IEDM Tech. Digest, Dec. 2002, pp. 843-846.
Eckert George
Kabushiki Kaisha Toshiba
Richards N. Drew
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