Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-07-05
2005-07-05
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S230030, C365S212000, C702S117000, C714S724000
Reexamination Certificate
active
06914834
ABSTRACT:
A system and a method for functionally testing fast semiconductor memory chips. The data shifting method proposed here is based on the fact that a low speed tester writes data and data strobe test patterns to a memory block with a low clock frequency. The connection between the tester and the memory chip is subsequently disconnected for all the data and data strobe lines. This can be done by a relay or integrated circuits on an external circuit board or by test modes in the output circuit of the memory chip, that is to say on-chip. The data and data strobe lights are subsequently divided into two groups of the same size and connected to one another. The data and data strobe test pattern written to the first memory block is then shifted with a high clock frequency into a second memory block, from where it is then shifted back into the first memory block in a further read-write cycle with the high clock frequency. The data pattern can subsequently be read out with a low clock frequency by the low speed tester and evaluated.
REFERENCES:
patent: 5946246 (1999-08-01), Jun et al.
patent: 6161206 (2000-12-01), Wasson
patent: 6169695 (2001-01-01), Duesman
Nguyen Dang T.
Nguyen Van Thu
LandOfFree
System and method for the functional testing of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for the functional testing of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for the functional testing of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3395104