Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-07-26
2005-07-26
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S333000, C257S334000, C257S331000, C257S332000, C257S329000, C438S259000, C438S412000, C438S270000, C438S272000
Reexamination Certificate
active
06921940
ABSTRACT:
A MOS transistor suitable for microscopic applications and a fabrication method thereof are disclosed. The fabrication method includes forming a trench by selectively etching a semiconductor substrate; forming a channel region consisting of a silicon layer with a predetermined width in the bottom of the trench and forming a gate oxide film on the channel region; forming a SiGe film on the gate oxide film and within the trench and burying the trench; forming a gate groove with a predetermined width to expose the gate oxide film by selectively etching the SiGe film; and forming a gate electrode by forming a silicon layer on the exposed gate oxide film such that the gate groove is buried.
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DongbuAnam Semiconductor Inc.
Flynn Nathan J.
Forde Remmon R.
Pillsbury Winthrop Shaw & Pittman LLP
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