MOS transistor and fabrication method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S333000, C257S334000, C257S331000, C257S332000, C257S329000, C438S259000, C438S412000, C438S270000, C438S272000

Reexamination Certificate

active

06921940

ABSTRACT:
A MOS transistor suitable for microscopic applications and a fabrication method thereof are disclosed. The fabrication method includes forming a trench by selectively etching a semiconductor substrate; forming a channel region consisting of a silicon layer with a predetermined width in the bottom of the trench and forming a gate oxide film on the channel region; forming a SiGe film on the gate oxide film and within the trench and burying the trench; forming a gate groove with a predetermined width to expose the gate oxide film by selectively etching the SiGe film; and forming a gate electrode by forming a silicon layer on the exposed gate oxide film such that the gate groove is buried.

REFERENCES:
patent: 6252277 (2001-06-01), Chan et al.
patent: 6365468 (2002-04-01), Yeh et al.
patent: 6399986 (2002-06-01), Ha
patent: 6475865 (2002-11-01), Yang et al.
patent: 6504224 (2003-01-01), Ahn et al.
patent: 6541859 (2003-04-01), Forbes et al.
patent: 6717200 (2004-04-01), Schamberger et al.
patent: 6720617 (2004-04-01), Einav
patent: 6818946 (2004-11-01), Venkatraman

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MOS transistor and fabrication method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MOS transistor and fabrication method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MOS transistor and fabrication method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3393228

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.