Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2005-07-19
2005-07-19
Walke, Amanda (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S311000, C252S500000, C524S262000
Reexamination Certificate
active
06919161
ABSTRACT:
Silicon-containing polymers comprising recurring units of formula (1) are novel wherein R1is a single bond or alkylene, R2is hydrogen or alkyl, R3, R4and R5are alkyl, haloalkyl, aryl or silicon-containing group, R6is hydrogen, methyl, cyano or —C(═O)OR8wherein R8is hydrogen, alkyl or acid labile group, R7is alkyl, —NR9R10or —OR11wherein R9, R10and R11are hydrogen or alkyl, a and b are positive numbers satisfying 0<a+b≦1. Resist compositions comprising the polymers are sensitive to high-energy radiation and have a high sensitivity and resolution at a wavelength of less than 300 nm and improved resistance to oxygen plasma etching.
REFERENCES:
patent: 4491628 (1985-01-01), Ito et al.
patent: 5310619 (1994-05-01), Crivello et al.
patent: 6492089 (2002-12-01), Hatakeyama et al.
patent: 63-27829 (1988-02-01), None
patent: 2-27660 (1990-06-01), None
patent: 5-158239 (1993-06-01), None
patent: 5-232706 (1993-09-01), None
patent: 5-249662 (1993-09-01), None
patent: 5-249683 (1993-09-01), None
patent: 5-257282 (1993-10-01), None
patent: 5-289322 (1993-11-01), None
patent: 5-289340 (1993-11-01), None
patent: 6-118651 (1994-04-01), None
patent: 9-73173 (1997-03-01), None
patent: 9-110938 (1997-04-01), None
patent: 9-230595 (1997-09-01), None
patent: 10-10739 (1998-01-01), None
patent: 10-324748 (1998-12-01), None
patent: 11-302382 (1999-11-01), None
patent: 2000212305 (2000-08-01), None
patent: 2001-158808 (2001-06-01), None
patent: 2002-256033 (2002-09-01), None
patent: 2002-348332 (2002-12-01), None
patent: WO 97/33198 (1997-09-01), None
English language translation of JP 2000-212305.
International Work Shop 157nm Lithography MIT-LL, Boston, MA, May 5, 1999.
J. Vac. Sci. Technol. B17(6), Nov./Dec. 1999.
J. Photopolymer Sci. and Technol., Vo. 13, No. 4 (2000), pp. 657-664 and pp. 451-458.
SPIE vol. 1925 (1993), p. 377.
J. Photopolymer Sci. and Technol., vol. 9, No. 3 (1996), ppg. 435-446.
SPIE vol. 3678, (1999), pp. 214, 241 and 562.
SPIE vol. 3678, (1999), p. 420.
Proc. SPIE, vol. 1262, p. 110 (1990).
Proc. SPIE, vol. 1466, p. 520 (1991).
Hatakeyama Jun
Ishihara Toshinobu
Takeda Takanobu
Birch & Stewart Kolasch & Birch, LLP
Shin-Etsu Chemical Co. , Ltd.
Walke Amanda
LandOfFree
Silicon-containing polymer, resist composition and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Silicon-containing polymer, resist composition and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Silicon-containing polymer, resist composition and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3393212