Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-09-13
2005-09-13
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S625000, C438S627000, C438S631000, C438S643000
Reexamination Certificate
active
06943105
ABSTRACT:
A soft metal conductor for use in a semiconductor device which has an uppermost layer consisting of grains having grain sizes sufficiently large so as to provide a substantially scratch-free surface upon polishing in a subsequent polishing step. The invention also provides a method for making a soft metal conductor that has a substantially scratch-free surface upon polishing by a multi-step deposition process, i.e., first sputtering at a higher temperature and then sputtering at a lower temperature and followed by another high temperature sputtering process. The invention further discloses a method for forming a substantially scratch-free surface on a soft metal conductor by first depositing a soft metal layer at a low deposition temperature and then annealing the soft metal layer at a higher temperature to increase the grain size of the metal. The invention also discloses a dual-step deposition method for making a soft metal conductor for use in an electronic device by first depositing a first layer of metal by a physical vapor deposition technique to a first thickness, and then depositing a second layer of metal on top of the first layer of metal to a second thickness larger than the first thickness by a method of chemical vapor deposition, electroplating or electroless plating. The first deposition process may further be conducted by a chemical vapor deposition technique, with the second deposition process conducted by a physical vapor deposition technique.
REFERENCES:
patent: 5084412 (1992-01-01), Nakasaki
patent: 5262354 (1993-11-01), Cote et al.
patent: 5281854 (1994-01-01), Wong
patent: 5345108 (1994-09-01), Kikkawa
patent: 5356836 (1994-10-01), Chen et al.
patent: 5373192 (1994-12-01), Eguchi
patent: 5399890 (1995-03-01), Okada et al.
patent: 5442235 (1995-08-01), Parrillo et al.
patent: 5523259 (1996-06-01), Merchant et al.
patent: 5534463 (1996-07-01), Lee et al.
patent: 5565707 (1996-10-01), Colgan et al.
patent: 5709958 (1998-01-01), Toyoda et al.
patent: 5973400 (1999-10-01), Murakami et al.
patent: 6030895 (2000-02-01), Joshi et al.
patent: 6090701 (2000-07-01), Hasunuma et al.
patent: 6285082 (2001-09-01), Joshi et al.
patent: 7-340833 (1924-10-01), None
patent: 4-284627 (1992-10-01), None
patent: 4-293232 (1992-10-01), None
patent: 4-363024 (1992-12-01), None
patent: 6-140393 (1994-05-01), None
patent: 6-216133 (1994-08-01), None
patent: 6-216260 (1994-08-01), None
patent: 6-349833 (1994-12-01), None
patent: 8-255836 (1996-10-01), None
Connolly Bove & Lodge & Hutz LLP
International Business Machines - Corporation
Picardat Kevin M.
Trepp Robert M.
LandOfFree
Soft metal conductor and method of making does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Soft metal conductor and method of making, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Soft metal conductor and method of making will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3392685