Semiconductor integrated device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S371000, C257S500000

Reexamination Certificate

active

06917081

ABSTRACT:
A semiconductor device is provided comprising several device components formed in the same substrate, such as a P-substrate having an offset Nch transistor including N-type source and drain each formed in a P-well spatially separated from one another, and the drain surrounded by a low concentration N-type diffusion layer; an offset Pch transistor including P-type source and drain each formed in an N-well spatially separated from one another, and the drain surrounded by a low concentration P-type diffusion layer; a triple well including a deep N-well, and a P-type IP well formed therein; a normal N-well for forming a Pch MOS transistor; and a normal P-well for forming an Nch MOS transistor; in which simultaneously formed are the low concentration N-type diffusion layer, N-well and normal N-well; the P-well and normal P-well; and the low concentration P-type diffusion layer and IP well.

REFERENCES:
patent: 4878096 (1989-10-01), Shirai et al.
patent: 5242841 (1993-09-01), Smayling et al.
patent: 5736445 (1998-04-01), Pfirsch
patent: 5880502 (1999-03-01), Lee et al.
patent: 6717206 (2004-04-01), Hsu et al.
patent: 2002/0098636 (2002-07-01), Soderbarg
patent: 6-334129 (1994-12-01), None
patent: 2000-286346 (2000-10-01), None

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