Method of designing semiconductor integrated circuit device...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S206000, C257S207000, C257S208000, C257S210000, C257S211000

Reexamination Certificate

active

06867465

ABSTRACT:
In a semiconductor integrated circuit device with a transistor, there are a single diffusion layer and a gate base electrode provided outside of the diffusion layer to extend in a pitch direction. N (N is an odd positive integer) gate electrodes are provided above the diffusion layer in parallel in the pitch direction to extend from the gate base electrode in a height direction orthogonal to the pitch direction to pass through the diffusion layer. Source nodes are provided on the diffusion layer along one of the N gate electrodes on a side outside the N gate electrodes in a direction opposing to the pitch direction as a head gate electrode. Drain nodes are provided on the diffusion layer along another of the N gate electrodes on a side outside the N gate electrodes in the pitch direction as a last gate electrode. The drain nodes are less than the source nodes.

REFERENCES:
patent: 6462364 (2002-10-01), Horiuchi
patent: 11-163642 (1999-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of designing semiconductor integrated circuit device... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of designing semiconductor integrated circuit device..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of designing semiconductor integrated circuit device... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3382568

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.