Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-05-17
2005-05-17
Norton, Nadine G. (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C714S723000, C714S724000, C714S725000, C714S743000, C714S744000
Reexamination Certificate
active
06893973
ABSTRACT:
Provided is a method of etching a silicon nitride film, which comprises subjecting the silicon nitride film located on copper to dry etching using a mixture of fluorocarbon gas and an inert gas as the reaction gas, the fluorocarbon gas containing CF4and CHF3supplied at flow rates in a ratio of 3:7 to 0:1 or contains CF4and CH2F2supplied at flow rates in a ratio of 2.5:1 to 0:1, thereby suppressing the formation of copper fluoride.
REFERENCES:
patent: 5643824 (1997-07-01), Chien et al.
patent: 5970373 (1999-10-01), Allen
patent: 6083822 (2000-07-01), Lee
patent: 6180512 (2001-01-01), Dai
patent: 6180518 (2001-01-01), Layadi et al.
patent: 6239455 (2001-05-01), Becker et al.
patent: 6294102 (2001-09-01), Bennett et al.
patent: 6297162 (2001-10-01), Jang et al.
patent: 6297163 (2001-10-01), Zhu et al.
patent: 6462395 (2002-10-01), Fukuda et al.
patent: 6600183 (2003-07-01), Visokay et al.
patent: 60-115231 (1985-06-01), None
patent: 60-115232 (1985-06-01), None
patent: 5-90221 (1993-04-01), None
patent: 10-303187 (1998-11-01), None
patent: 11186224 (1999-07-01), None
patent: 11-220021 (1999-08-01), None
patent: 11-307516 (1999-11-01), None
NEC Electronics Corporation
Norton Nadine G.
Tran Binh X.
Young & Thompson
LandOfFree
Method of etching silicon nitride film and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of etching silicon nitride film and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of etching silicon nitride film and method of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3369217