Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2000-08-15
2004-06-29
Mulpuri, Savitri (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C438S459000, C438S464000, C438S977000
Reexamination Certificate
active
06756289
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a method of producing a semiconductor member and a method of producing a solar cell. More particularly, the present invention relates to a method of producing a semiconductor member comprising a thin film crystal formed on an inexpensive substrate and a method of producing a solar cell with high performance by using the semiconductor member.
2. Related Background Art
There have been extensively researched a solar cell as a power supply which is systematically coupled with a driving energy source of various equipments or a commercial power. The solar cell is so desired that a device can be formed on an inexpensive substrate to comply with a cost demand. On the other hand, there has been normally employed silicon as semiconductor constituting the solar cell. In particular, from the viewpoint of the efficiency of converting a light energy into an electric power, that is, from the viewpoint of the photoelectric conversion efficiency, single-crystal silicon is very excellent. On the other hand, from the viewpoint of increase in area and reduction in costs, an amorphous silicon is advantageous. Also, in recent years, for the purpose of obtaining the low costs as low as amorphous silicon and high energy conversion efficiency as high as single-crystal, polycrystal silicon has become used.
However, in single-crystal or polycrystal silicon, since a lump-shaped crystal is sliced into a plate-shaped substrate, it is difficult to make its thickness 0.3 mm or less. Thus, the material used for the substrate has not been effectively utilized because the substrate generally has a thickness much over a thickness necessary for absorbing an incident light (20 &mgr;m to 50 &mgr;m). Also, in recent years, there has been proposed a method of forming a silicon sheet by using a spin method in which a liquid droplet of melted silicon is allowed to flow into a die. Even in this method, the thickness of the substrate is about 0.1 to 0.2 mm at the minimum, which is not sufficiently thinned. In other words, there is a room for more reducing the costs by further thinning silicon.
To achieve the above, there has been proposed an attempt of achieving high energy conversion efficiency and low costs of a solar cell in which a thin epitaxial layer grown on a single-crystal silicon substrate is separated (peeled) from the substrate (Milnes, A. G. and Feucht, D. L., “Peeled Film Technology Solar Cells”, IEEE Photovoltaic Specialist Conference, p. 338, 1975). In this method, an intermediate layer of SiGe is interposed between single-crystal silicon for forming the substrate and the grown epitaxial layer, and a silicon layer is allowed to (hetero) epitaxially grow thereon. Therefore, the intermediate layer is selectively melted so that the growth layer is peeled off. However, in general, the hetero-epitaxially grown layer is liable to have defects induced on a growth interface because the layer is different in lattice constant from the substrate. Also, this method is not advantageous in the process costs because of use of a material such as germanium which is remarkably expensive more than silicon.
Also, U.S. Pat. No. 4,816,420 discloses that a thin crystal solar cell is obtained by making selective epitaxial growth on a crystal substrate through a mask material, forming sheet-like crystal by using a method of allowing crystal to laterally grow, and thereafter separating the crystal from the substrate. However, in this method, since the sheet-like crystal is mechanically peeled off using cleavage, the sheet-like crystal is liable to be damaged during a peel-off process when the crystal has a certain size or more. In particular, in the case of increasing the area of the crystal as in the solar cell, it becomes difficult to practically employ the above method.
Also, Japanese Patent Application Laid-Open No. 6-45622 discloses that after a porous silicon layer is formed in the surface region of a silicon wafer surface by anodization, the porous layer is peeled off from the wafer, and after the peeled porous layer is fixed onto a metal substrate, an epitaxial layer is formed on the porous layer, to thereby fabricate a thin-film crystal solar cell by using this. However, in this method, since the metal substrate is exposed to a high-temperature process, impurities are liable to be mixed into the epitaxial layer, which leads to a problem that the characteristic is restricted. Also, as realized in the amorphous silicon solar battery, if a thin semiconductor layer is formed on a flexible substrate, for example, a film of polymer such as polyimide, it can be located on a substance having a curved surface, thus expecting the enlargement of an applied field. However, because a high temperature is required in a process of the above-mentioned single-crystal or polycrystal silicon solar cell, it is difficult to use a substrate having poor heat resistance at a high temperature.
By the way, Japanese Patent Application Laid-Open No. 8-213645 discloses that an active layer of the solar cell is allowed to epitaxially grow on amorphous silicon formed in the surface region of a silicon wafer by anodization, and thereafter the active layer can be peeled off from a portion of the porous silicon layer. Therefore, not only the expensive single-crystal substrate can be repeatedly utilized, but also a high-efficiency solar cell can be formed on a flexible low-heat-resistant substrate. However, according to the disclosure of Japanese Patent Application Laid-Open No. 8-213645, the epitaxial growth of the active layer is conducted by the CVD method. In the CVD method, a source gas such as dichlorosilane (SiH
2
Cl
2
) or trichlorosilane (SiHCl
3
) and a large amount of hydrogen gas are used. When a silicon film is deposited to 20 to 50 &mgr;m in thickness by using a large amount of the expensive gas, it is correspondingly expensive and considerably disadvantageous from the viewpoint of the costs in comparison with amorphous silicon which is required to be deposited to at most 0.5 to 1.0 &mgr;m in thickness.
SUMMARY OF THE INVENTION
The present invention has been made in view of the above circumstances, and therefore an object of the present invention is to provide a method of producing a semiconductor member excellent in characteristics and a method of producing a solar cell by using the semiconductor member.
Another object of the present invention is to provide a method of producing a semiconductor member in which crystal semiconductor excellent in various characteristics can be formed even on a substrate having no high-temperature resistant property and a method of producing a solar cell by using the semiconductor member.
Still another object of the present invention is to provide a method of producing a semiconductor member in which crystal semiconductor excellent in various characteristics can be formed even on a flexible substrate and a method of producing a solar cell by using the semiconductor member.
A further object of the present invention is to provide a method of producing a semiconductor member which can be variously applied, used and arranged and a method of producing a solar cell by using the semiconductor member.
A still further object of the present invention is to provide a method of producing a semiconductor member having excellent semiconductor characteristics at low costs and a method of producing a solar cell having various characteristics such as excellent photoelectric conversion characteristics or use characteristics at low costs by using the semiconductor member.
A still further object of the present invention is to provide a method of producing a solar cell which can exhibit high conversion efficiency.
A still further object of the present invention is to provide a semiconductor member which can be obtained by peeling off an epitaxial layer formed on a crystal substrate from the crystal substrate while reusing the crystal substrate, to provide a semiconductor member having high performance at low costs by use of an inexpensive raw mat
Nakagawa Katsumi
Nishida Shoji
Sakaguchi Kiyofumi
Yonehara Takao
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Mulpuri Savitri
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