Self-annealed thin film deposition process

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06780291

ABSTRACT:

FIELD OF THE INVENTION
This invention relates to the fabrication of thin films of magnetic material by sputter deposition.
BACKGROUND OF THE INVENTION
To increase the areal recording densities in both longitudinal and perpendicular magnetic information data storage media, a reduction in the recording film thickness is desirable. However, as the film thickness is reduced for narrow transition parameters in both longitudinal and perpendicular recording films, the magnetic volume energy (K
U
×V) of magnetic grains in the films can be less than the thermal fluctuation energy (K
B
×T) of the magnetic recording media, which limits storage density due to superparamagnetic effects. The magnetic energy should be larger than thermal fluctuation energy to safely store information in the recorded magnetic bit pattern. This can be expressed as:
(
K
U
×V
)>(
k
B
×T
)  (Equation 1)
where, K
U
is the magnetic anisotropy energy of a magnetic grain; V is the magnetic grain volume; k
B
is Boltzman's constant; and T is the absolute temperature.
To enhance the magnetic energy in ultra thin storage films, the development of recording films with large magnetic anisotropy energy has received much attention. Among the recording films, an L1o phase ordered FCT (Face Centered Tetragonal) FePt film is a strong candidate for high anisotropy energy films beyond 10
7
ergs/cc.
FePt thin films can be fabricated though sputter deposition. An as-deposited FePt film forms a chemically disordered FCC (Face Centered Cubic) crystallographic structure with soft magnetic properties in its hysteresis loop, such as a coercivity of less than a few hundred Oe. It is well known that an external thermal energy supplement, such as by pre-heating a substrate, in-situ heating of a growing film, and/or post-annealing of the as-deposited film, can convert the disordered FCC film structure to a chemically ordered FCT film structure which shows a large magnetic coercivity and an anisotropy energy beyond 5.0 kOe and 10
7
ergs/cc, respectively. The changes in coercivity and/or anisotropy energy can be regarded as being proportional to the degree of FCT transformation in the FePt film.
Thin film fabrication processes using external thermal energy supplements, such as the pre-heating a substrate, in-situ heating of a growing film, and/or post-annealing of an as-deposited film, have been used for Cr segregation in CoCr based alloy films and phase transformation in FePt based alloy films. However, such external energy processes limit the deposition environments in terms of high temperature facilities and materials, and add fabrication cost.
Because the currently used external heating methods require treatment using temperatures beyond 600° C. and long heat treatment times of more than 1 hour to achieve high coercivity and/or anisotropy energy, the fabrication of such films usually requires expensive film production equipment and high system maintenance costs, which are not practical for the large scale production of the film. To reduce the required temperature and time parameters, an alternative method to fully or partially compensate for the external energy supplements should be developed.
Thus there is a need for a thin film fabrication process, which can fully or partially compensate for the external energy supplement in the manufacture of information data storage media, including magnetic and optic recording films.
SUMMARY OF THE INVENTION
This invention provides a method of manufacturing a thin film of magnetic material, comprising sputtering magnetic material from a target to a substrate to form a thin film of the magnetic material on the substrate, wherein the ratio of sputtering power in Watt to sputtering pressure in mTorr is greater than one. The target can include at least two of: Fe, Co, Ni, Cr, Pt and Pd. The sputtering pressure can be greater than 100 mTorr. The sputtering power can be greater than 300 Watts. The thin film can comprise a face centered tetragonal structure, including at least two of: Fe, Co, Ni, Cr, Pt and Pd. The substrate can comprise one of: glass, MgO, or silicon. The thin film can have a magnetic coercivity greater than 10 kOe. The method can further comprise annealing the thin film. The thickness of the thin film can be in the range of 5 nm to 200 nm.
Thin films of magnetic material made according to the method and magnetic storage media including a thin film of magnetic material made according to the method are also included.
In another aspect, the invention encompasses a thin film of magnetic material comprising a plurality of face centered tetragonal particles produced by thermalizing face centered cubic particles in a plasma during a plasma deposition process. The particles can comprise an alloy selected from the group of: FePd, FeNiPt, FeNiPd, CoPt, CoPd, CoNiPt, and CoNiPd. The thickness of the film can be in the range of 5 nm to 200 nm.


REFERENCES:
patent: 4093453 (1978-06-01), Makino et al.
patent: 5066552 (1991-11-01), Howard et al.
patent: 5363794 (1994-11-01), Lairson et al.
patent: 5603766 (1997-02-01), Visokay et al.
patent: 5824409 (1998-10-01), Sellmyer et al.
patent: 5989728 (1999-11-01), Coffey et al.
patent: 6007623 (1999-12-01), Thiele et al.
patent: 6033536 (2000-03-01), Ichihara et al.
patent: 6068739 (2000-05-01), Suzuki et al.
patent: 6086974 (2000-07-01), Thiele et al.
patent: 6139907 (2000-10-01), Sellmyer et al.
patent: 6183606 (2001-02-01), Kuo et al.
patent: 6190516 (2001-02-01), Xiong et al.
patent: 6277484 (2001-08-01), Shimoda et al.
patent: 6296955 (2001-10-01), Hossain et al.
patent: 6331364 (2001-12-01), Baglin et al.
patent: 6377414 (2002-04-01), Wang
Suzuki et al. “Preparation of ordered Fe-Pt thin films for perpendicular magnetic recording media”, Journal of Magnetism and Magnetic Materials, 193, 1999, 85-88.*
Park et al. “Effects of Annealing Condition on the Structural and Magnetic Properties of FePt thin Films”, IEEE Transactions on Magnetics, vol. 35, No. 5 Sep. 1999.*
Christodoulides et al. “CoPt and FePt thin films for high density recording media” Journal of Applied Physics, vol. 87, No. 9, pp. 6938-6940.*
M. L. Williams et al., “Analytical Model of the Write Process in Digital Magnetic Recording,”AIP Conf. Proc., vol. 5, 1972, pp. 738-742.
B. K. Middleton et al., “Perpendicular Recording,”IEEE Conf. Pros., vol. 54, 1982, pp. 181-192.
M. R. Visokay et al., “Direct Formation of Ordered CoPt and FePt Compound Thin Films by Sputtering,”Appl. Phys. Lett., vol. 66, No. 13, Mar. 27, 1995, pp. 1692-1694.
R. F. C. Farrow et al., “Growth Temperature Dependence of Long-Range Alloy Order and Magnetic Properties of Epitaxial FexPt1-x(X≅0.5) Films,”Appl. Phys. Lett., vol. 69, No. 8, Aug. 19, 1996, pp. 1166-1168.
M. H. Hong et al., Microstructure of FePt/Pt Magnetic Thin Films With High Perpendicular Coercivity,Journal of Applied Physics, vol. 84, No. 8, Oct. 15, 1998.
T. Suzuki et al., “Preparation of Ordered Fe-Pt Thin Films for Perpendicular Magnetic Recording Media,” (Abstract),Journal of Magnetism and Magnetic Materials, vol. 193, Issues 1-3, Mar. 1999, pp. 85-88.
T. Suzuki et al., “Fe-Pt Media for Perpendicular Magnetic Recording,”IEEE Transactions on Magnetics, vol. 35, No. 5, Sep. 1999, pp. 2748-2750.
B. Bian et al., “Fabrication and Nanostructure of Oriented FePt Particles,”Journal of Applied Physics, vol. 87, No. 9, May 1, 2000, pp. 6962-6964.
J. A. Christodoulides et al., “CoPt and FePt Thin Films for High Density Recording Media,”Journal of Applied Physics, vol. 87, No. 9, May 1, 2000, pp. 6938-6940.
Y.-N. Hsu et al., “In Situ Ordering of FePt Thin Films by Using Ag/Si and Ag/Mn3Si/Ag/Si Templates,”IEEE Transactions on Magnetics, vol. 36, No. 5, Sep. 2000, pp. 2945-2947.
S.-R. Lee et al., “Rapid Ordering of Zr-Doped FePt Alloy Films,”Applied Physics Letters, vol. 78, No. 25, Jun. 18, 2001, pp. 4001-4003.
S. Jeong et al., “Atomic Ordering and Coercivity Mechanism in FePt and CoPt Polycrystalline Thin Films,”IEEE Transactions on Magnetics, vol. 37, No. 4, Jul. 2001, pp. 1299-1301.
Y. K. Takahashi et al., “Lo

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Self-annealed thin film deposition process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-annealed thin film deposition process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-annealed thin film deposition process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3296244

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.