Emulator, a data processing system including an emulator,...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Details

C712S244000

Reexamination Certificate

active

06742142

ABSTRACT:

CROSS REFERENCE TO RELATED APPLICATIONS
This application claims benefit of priority under 35 USC 119 based on Japanese patent application PH11-371736 filed Dec. 27, 1999, the entire contents of which are incorporated by reference herein.
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an emulator and a method of emulation for using testing a system having complex interfaces such as RAMBUS interface or DRAM interface.
2. Description of Related Art
System LSIs (Large Scale Integration) and microprocessors are directed much research to method of so-called system on-chip. High-speed and low amplitude memory interfaces such as RAMBUS I/F (Interface) or DRAM I/F have become the de-facto standard for memory interfaces.
FIG. 1
illustrates a system chip having a RAMBUS I/F and a DRAM I/F. In
FIG. 1
, this system chip
100
comprises a CPU
101
connected to a system bus
102
, a RAMBUS I/F
103
, and a DRAM I/F
104
connected to the system bus
102
. The RAMBUS I/F
103
and DRAM I/F
104
are connected to a tester
105
. The tester
105
outputs and inputs data to/from the system chip
100
via these I/Fs.
In such case, it becomes very difficult to test under the regulation frequency employing conventional tester since the system chip having complex interfaces such as the RAMBUS I/F
103
or DRAM I/F
104
is getting more complex, i.e. higher transfer speed and lower amplitude. On the other hand, the stable testing could not be realized even if the test could carry out. Or these tests need to be employed a high-performance, expensive and inflexible tester.
FIG. 2
illustrates a system chip having a scan register
112
. In
FIG. 2
, the scan register
112
is used for scanning the internal status of the system chip
110
. The scan register
112
is provided between the system bus
113
and the CPU
111
to store the test vector and the result. To examine the internal status of the system chip
110
, the system chip
110
had to be suspended, and then the stored test results in the scan register
112
are shifted to the tester
115
via RAMBUS
115
.
The test using the scan register may cause failure since the system chip has special I/Fs like RAMBUS I/F as mentioned above. And it is impossible to test depending on operation frequency of the system chip since the system chip must be suspended.
SUMMARY OF THE INVENTION
The present invention is to provide an emulator and a method of emulation for using testing a system having complex interfaces capable of stable testing can be realize under the system regulation frequency or less frequency without using the high-performance and expensive tester.
The emulator of this invention comprises a content addressable memory (CAM) configured to store addresses accessed by a system to be tested, a memory unit having storage area corresponding to the entry of the CAM, configured to store data corresponding to the address stored in the CAM and test information for emulation, a shift register configured to store data and test information from a tester and transfer the data and the test information to the CAM and the memory unit, and a state machine configured to receive a request from a system or a tester and control transferring between a system and a tester.


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patent: 4982360 (1991-01-01), Johnson et al.
patent: 5774695 (1998-06-01), Autrey et al.
patent: 5911059 (1999-06-01), Profit, Jr.
patent: 5951704 (1999-09-01), Sauer et al.
patent: 6085244 (2000-07-01), Wookey
patent: 6522985 (2003-02-01), Swoboda et al.
patent: 6564339 (2003-05-01), Swoboda et al.
patent: 6567933 (2003-05-01), Swoboda et al.
patent: 5-189267 (1993-07-01), None
patent: 8-147184 (1996-06-01), None

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