Dynamic random access memory device with build-in test mode disc

Details Dynamic random access memory device with build-in test mode disc Dynamic random access memory device with build-in test mode disc

1992-01-22

1993-12-21

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

36518909, 36523006, 371 211, G11C 2900

Patent

active

052726738

ABSTRACT:
A dynamic random access memory device can enter a diagnostic mode of operation to see whether or not undesirable short-circuit takes place in a word line and/or a control signal line for transfer gates between bit lines and a sense amplifier unit, and a built-in testing operation discriminating unit discriminates the testing operation on the word lines and the control signal lines from other testing operations for causing a power supply system to interrupt electric power to a row address decoder unit and a driver unit for the control signal lines so that voltage level on a word line and/or a control signal line is rapidly decayed due to the short-circuit, thereby screening out the defective products before the delivery from the manufacturer.

REFERENCES:
patent: 4742490 (1988-05-01), Hoffmann
patent: 5023840 (1991-06-01), Tobita
patent: 5117393 (1992-05-01), Miyazawa et al.
patent: 5119337 (1992-06-01), Shimizu et al.

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