Fishing – trapping – and vermin destroying
Patent
1992-12-28
1995-02-14
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
148DIG147, 437238, 437248, H01L 2144, H01L 2148
Patent
active
053895762
ABSTRACT:
A method substantially eliminating consumption of silicon from semiconductor devices is provided. The method includes controlling gases within the environment wherein the semiconductor device is positioned. The environment is formed to include an inert gas and oxygen. The oxygen content is formed to have a concentration between approximately 1.times.10.sup.1 and 1.times.10.sup.5 parts per million. Such an oxygen concentration substantially prevents converting silicon from the semiconductor device into silicon monoxide thereby substantially eliminating silicon consumption.
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K. Hofman et al, "Defect Formation In Termal SiO.sub.2 by High-Temperature Annealing", Applied Physics Letter, vol. 49, No. 22, pp. 1525-1527, Dec. 1, 1992.
Barbee Joe E.
Chaudhuri Olik
Everhart C.
Motorola Inc.
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