Methods of cleaning semiconductor substrates after polishing

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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437228, 437946, 252 793, H01L 21306

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active

053891945

ABSTRACT:
A method of cleaning semiconductor substrates after polishing, particularly chem-mech polishing a semiconductor substrate to planarize a layer, to remove excess material from atop a layer, and to strip back a defective layer is disclosed. Aluminum oxide particles having a small, well controlled size, and substantially in the alpha phase provide beneficial results when polishing. A phosphoric acid cleaning solution is used. The aluminum oxide particles are soluble in the phosphoric acid solution, which does not significantly attack silicon dioxide. The phosphoric acid solution can include a small concentration of hydrofluoric acid to aid in removing silicon dioxide detritus from the surface of the wafer.

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