Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-08
2008-07-08
Karlsen, Ernest F (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C257S048000, C374S057000
Reexamination Certificate
active
07397260
ABSTRACT:
A microelectronic element such as a chip or microelectronic wiring substrate is provided which includes a plurality of conductive interconnects for improved resistance to thermal stress. At least some of the conductive interconnects include a metallic plate, a metallic connecting line and an upper metallic via. The metallic connecting line has an upper surface at least substantially level with an upper surface of the metallic plate, an inner end connected to the metallic plate at one of the peripheral edges, and an outer end horizontally displaced from the one peripheral edge. The metallic connecting line has a width much smaller than the width of the one peripheral edge of the metallic plate and has length greater than the width of the one peripheral edge. The upper metallic via has a bottom end in contact with the metallic connecting line at a location that is horizontally displaced from the one peripheral edge by at least about 3 microns (μm).
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PCT International Search Report, PCT Application No. PCT/EP2006/067590, mailed Mar. 5, 2007.
Agarwala Birendra
Chanda Kaushik
Clevenger Lawrence A.
Cowley Andrew P.
Filippi Ronald G.
International Business Machines - Corporation
Karlsen Ernest F
Neff Daryl K.
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