Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2008-01-29
2008-01-29
Lee, Calvin (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C216S041000
Reexamination Certificate
active
07323417
ABSTRACT:
The present invention provides a method of forming recesses on a substrate, the method including forming on the substrate a patterning layer having first features; trim etching the first features to define trimmed features having a shape; and transferring an inverse of the shape into the substrate.
REFERENCES:
patent: 7186656 (2007-03-01), Sreenivasan
patent: 2004/0211754 (2004-10-01), Sreenivasan
Carter Michael D.
Fish & Richardson P.C.
Lee Calvin
Molecular Imprints, Inc.
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